Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
-- Innovative mating technique resolves the problems with intermittent power delivery and signal interruptions inherent in traditional MMCX connectors -- Ideally suited for critical sensors and video ...
Gallium nitride (GaN) RF transistors have traditionally been depletion mode, making them difficult to bias. High frequency enhancement mode transistors, such as the EPC8000 series eGaN FETs from EPC, ...
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